Colloidal Probe Atomic Force Microscopy requires a tip of known shape to be mounted cleanly on a consistently reproducible cantilever. These probes are known as “Colloidal Probes” and are used to study colloidal interactions between two surfaces and to quantify the interactive properties. The tip is formed using a spherical, colloidal particle that is attached to a tipless cantilever. Сolloidal probes are manufactured in the state-of-the-art clean room using micromachining techniques and a high precision, 6 axis, micromanipulator stage system. Near perfect micro-spheres of various materials are attached at the end of tipless cantilevers using a proprietary, clean, contamination free process.

Colloidal Probe Application
Colloidal Probe applications include direct surface force measurement, colloidal interactions on the single particle-particle level, direct measurement of cell mechanics, measurement of adhesion forces, study of colloidal interactions between particle and surface. These are just a few application out of a fast growing field using colloidal probe technique.
 
Colloidal Probe Specification
 
Material
Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped
Chip size
3.4x1.6x0.3mm
Cantilever number
1 rectangular, tipless
Reflective side
Au
 
 
Available types of colloidal probes
SiO2 (only size A), BSG
Sphere size
A - 5 um to 9 um
Available sizes of BSG spheres (for SiO2 spheres available only size A)
B - 10 um to 14 um
C - 20 um or more
 

Tipless cantilever specification:

Cantilever length, L±10µm

 
Cantilever width, W±6µm
Cantilever thickness,
T±0.5 µm
Resonant frequency, kHz
Force constant, N/m
min
typical
max
min
typical
max
225
27
2.7
43
62
81
0.6
1.6
3.7

 

Ordering code:
 
CPFM                _             SiO2       -       A       /      Au                     /        5
PROBE SERIES _ TYPE OF SPHERES – SIZE  / Reflective Coating  /   ORDERING NUMBER

 

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