High Resolution NONCONTACT "GOLDEN" Silicon AFM probes NSG03 series

 

NSG03 series specification

 

Material

Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped

Chip size

3.4x1.6x0.3mm

Reflective side

Au

Cantilever number

1 rectangular

Tip curvature radius

typical 6nm, guaranteed 10nm

Available coatings

conductive PtIr, Au;

Available probe

bare, tipless, with Al reflective coating

 

   

Cantilever series

Cantilever length, L±5µm

Cantilever width, W±3µm

Cantilever thickness,

T±0.5 µm

Resonant frequency, kHz

Force constant, N/m

min

typical

max

min

typical

max

NSG03

135

30

1.5

47

90

150

0.35

1.74

6.1

 

Copyright © 2017 - 2024 ScanSens. All rights reserved.